WG2013 156-Channel Digital Source Meter

The WG2013 is a high-density benchtop 156-channel digital source meter built for parallel voltage/current sourcing and real-time monitoring in optical module burn-in, optoelectronic device aging, and semiconductor batch testing. It integrates 156 programmable common-ground power outputs into a single benchtop unit, delivering 1 mV voltage resolution with constant-voltage (CV) and constant-current (CC) modes. Synchronous trigger capability allows multi-channel voltage settings to take effect simultaneously, while global and local shutdown functions provide layered safety control during unattended long-term aging runs. USB/RS232 programming and full host software support integration into automated production lines and MES-driven test stations.

Key Features

156 output channels in one benchtop unit: High channel density designed for parallel aging and batch testing of optical modules and multi-device fixtures, reducing rack space versus stacking multiple lower-channel-count instruments.
0–20 V output range, 0–100 mA current range: Per official specifications, with channel-level real-time voltage and current monitoring。
1 mV voltage setting resolution: Fine-grained bias control for low-voltage device characterization and leakage current measurements.
CV and CC dual output modes: Constant-voltage and constant-current operation selectable per channel requirement.
Synchronous trigger: Multi-channel voltage settings take effect simultaneously, supporting coordinated stress or parameter sweep tests across many devices.
Global and local shutdown: Two-layer safety architecture allows the entire system or individual channel groups to be disabled when fault conditions are detected.
USB and RS232 programmable control: Full-function host software included, enabling automated test sequencing, data logging, and threshold-alarm integration.
Benchtop form factor: 450 × 480 × 132 mm, approx. 8.2 kg, operating temperature -10°C to +50°C, AC 100–250 V input。

Typical Applications

Optical module burn-in and aging power supply/monitoring
Optoelectronic device and optical communication component batch electrical testing
Semiconductor chip I-V characterization and leakage current screening
New energy storage device performance testing
High-channel-count laboratory precision sourcing and monitoring