WG3039 Multi-Channel Programmable Optical Power Meter

The WG3039 is a benchtop multi-channel programmable optical power meter built for COC (chip-on-carrier) photonic chip burn-in monitoring and 400G/800G high-speed optical module parallel production testing. It uses a PD detection architecture with simultaneous parallel sampling across channels, eliminating the polling delay and timing skew of conventional switched-channel meters. With built-in temperature compensation and SCPI-compatible LAN/USB control, it is designed to remain stable under the thermal cycling conditions of burn-in ovens and high-low temperature reliability chambers.

Key Features

• Multi-channel simultaneous acquisition: Parallel sampling across configured ports with no sequential switching or polling delay, capturing power data in millisecond-level synchronization.
• 1260–1650nm coverage: Full O-band through L-band coverage, compatible with LAN-WDM, CWDM, and DWDM transmission schemes used in 400G/800G modules.
• ±0.1 dB accuracy, ≤0.05 dB repeatability: Closed-loop calibration per channel, with channel-to-channel consistency suitable for pass/fail judgment in volume production.
• Built-in real-time temperature compensation: Suppresses measurement drift across the -10°C to +50°C range, maintaining data stability inside burn-in chambers and thermal cycling environments.
• SCPI programmable via LAN and USB: Direct integration into COC aging platforms, ATE systems, and MES production lines; supports continuous data logging, threshold alarm, and SDK-based secondary development.
• Flexible fiber interface compatibility: FC/APC and LC options, with channel count selectable to match the aging fixture or test station configuration.
• Industrial continuous-operation design: Rated for 7×24 production-line duty, with low noise floor for weak-signal detection during long-term aging decay monitoring.

Typical Applications

• COC photonic chip burn-in and high-temperature accelerated aging power monitoring
• 400G / 800G optical transceiver module multi-port parallel production testing
• Silicon photonics chip and multi-channel array device power characterization
• High-low temperature reliability testing with per-channel data traceability
• Automated aging stations requiring threshold alarm and continuous logging